Copyright Bede plc © 2005

We are pleased to announce that Bede PLC and Bede Scientific Instruments Ltd business has been acquired by Jordan Valley Semiconductors Ltd and Jordan Valley Semiconductors UK Ltd .
Effective Monday April 14th  2008, Bede operates under Jordan Valley management (“effective date”).

Please revisit this site for more announcements or use the link below for more information on Jordan Valley Semiconductors.

http://www.jordanvalleysemi.com/

Bede is the global leader in non-destructive X-ray metrology systems for 90nm technology nodes and below. Bede systems deliver dramatic yield enhancement through the absolute measurement of semiconductor material properties.  These measurements include not only thickness, but also structure, roughness and composition, which are crucial for new materials and processes.

Bede systems incorporate one or more of the following X-ray techniques to optimize sensitivity to our customers' processes:

• High-Resolution X-ray Diffraction (HRXRD)
• X-ray Diffraction (XRD)
• X-ray Reflectivity (XRR)
• X-ray Fluorescence (XRF)
• X-ray Diffraction Imaging (XRDI)

Bede's process control solutions provide fast measurement capability on <100 micron test pads and in scribe-lines on product wafers with ScribeView™, reducing process development costs and eliminating the need for monitor wafers.

Visit Why X-ray Metrology? to learn more about X-ray metrology, and how it can solve problems in your manufacturing process.

Visit the Knowledge Base for Bede white papers, technical articles, brochures and the NEW book X-ray Metrology in Semiconductor Manufacturing by Keith Bowen and Brian Tanner.